ELECTRICAL CHARACTERISATION


The main activities of this service deal with:

 

  • Device Characterisation and parameter extraction (SPICE)
  • Equipment maintenance and set up
  • Production wafer parametric test
  • Test structure design and characterisationNew measurement techniques development
  • Application specific system design and development (demonstrators)

People responsible/contacts:
Joaquín Santander (joaquin.santander@cnm.es)
Miquel Zabala (miquel.zabala@cnm.es)

 

EQUIPMENT AVAILABLE

1.- High performance DC measurement system

  • Semiconductor parameter analyser
  • Switching matrix with controller
  • Automatic wafer prober
  • System control
  • Workstation and related software

2.- Static and dynamic power device measurement system

  • Source-measurement units (4)
  • Curve tracers (high and low power)
  • Digital oscilloscope
  • SourceMeter system
  • Semi-automatic wafer prober
  • Electrostatic discharge generator
  • High voltage power supply
  • System control workstation and related software

3.- Impedance analysis system

  • Fast capacimeterImpedance analyser
  • Picoamperimeter
  • Automatic wafer prober
  • System control workstation and related Software

4.- Dynamic and functional digital characterisation system

  • Logic analyser
  • Pulse generator
  • Digital oscilloscope
  • Digital multimeter
  • Automatic wafer prober
  • System control workstation and related software

5.- Physical sensor characterisation system

  • Climatic chamber
  • Stoves (2)
  • Voltage scanner (2)
  • Digital multimeter (2)
  • Digital thermometer
  • Pressure controller/calibrator (2)
  • System control workstation and related software

5.- Physical sensor characterisation system

  • Climatic chamber
  • Stoves (2)
  • Voltage scanner (2)
  • Digital multimeter (2)
  • Digital thermometer
  • Pressure controller/calibrator (2)
  • System control workstation and related software

6.-Chemical sensor characterisation system

  • Impedance analyser
  • Glass electrodes
  • Flow systems for calibration
  • Conductivity meter(2)
  • pH-meter (5) and ISFET-meter(3)
  • Potentiostat/Galvanostat

7.- Infrared thermography system

8.- Other specialised equipment

  • Semiconductor parameter analyser
  • Network analyser
  • Spectrum analyser
  • Manual wafer prober BTS system

9.- General purpose DC and AC measurement system

  • Power supplies, digital multimeters, current and voltage sources, digital counter, digital oscilloscopes, arbitrary/function generators, ...


 

 
Contact: Dt@cnm.es